منابع مشابه
Impact induced damage beneath craters
Ackermann et al. (1975) described the subsurface structure of Meteor Crater and identified a fractured rock zone extending to about 1 km deep. The depth of the fractured/damage zone can be used to extract information about the impact cratering process. We impacted rock samples (San Marcos gabbro) in the laboratory and imaged the damage structure using both dicing and tomography methods. We prop...
متن کاملAn Experimental Tomography Study of Impact-induced Damage Beneath
Introduction: Large scale reductions in compressional velocity caused by impact-induced damage is an important but largely unstudied feature of impact craters [1]. Damage depth beneath impact craters can be used to extract information about the impact cratering process. A new non-destructive method is developed to study the damage structure beneath impact craters in the laboratory. Experimental...
متن کاملBuried layers beneath south rim of Valles Marineris revealed by central uplift of impact craters
Introduction: Mars Orbiter Camera (MOC) revealed over the last decade light-toned deposits at the surface of Mars [1]. These deposits outcrop mainly between 30°N and 30° S, i.e. in the equatorial regions [2]. They are observed in distinct contexts : 1) In the Valles Marineris canyon system with as thick as 4 km of light toned layers inside the canyons [3], and a few meter thick sequence of ligh...
متن کاملImpact craters on Titan
Five certain impact craters and 44 additional nearly certain and probable ones have been identified on the 22% of Titan’s surface imaged by Cassini’s high-resolution radar through December 2007. The certain craters have morphologies similar to impact craters on rocky planets, as well as two with radar bright, jagged rims. The less certain craters often appear to be eroded versions of the certai...
متن کاملSecondary ion mass spectrometry induced damage adjacent to analysis craters in silicon
Damage introduced by dynamic secondary ion mass spectrometry ~SIMS! depth profiling is studied. A silicon sample with a boron marker layer was depth profiled by dynamic SIMS. After subsequent annealing at 750 °C for 30 min, the SIMS sample was reanalyzed by plan-view transmission electron microscope ~PTEM! and SIMS. PTEM images showed the presence of interstitial defects near the original SIMS ...
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ژورنال
عنوان ژورنال: Geophysical Research Letters
سال: 2001
ISSN: 0094-8276
DOI: 10.1029/2001gl013001